Reliability and Failure Analysis
Reliability Test service
| Type |
Test item |
Standard |
Condition |
| Optical module |
Temperature Cycling |
J-ESD22-A104/MIL-STD-883 Method 1010.7 |
-40℃–85℃ 500cycles |
| Temperature and Humidity Biased/Unbiased |
JESD22-A101/EIAJ-IC-121 |
85 ℃ 85% RH 1000 hrs |
| High Temperature Storage Life |
MIL-STD-883 Method 1008 |
58℃ 2000hrs with bias
85℃ 2000hrs without bias
|
| Pressure Cooker/Autoclave |
JESD22-A102 |
121℃, 100% RH, 29.7psia, 96H |
| HAST Biased/Unbiased |
JESD22-A110, JESD22-A118 |
130℃, 85% RH, 96hrs, without bias |
Major Equipments of Reliability
 |
- Name: Presure cook chamber
- Function: Presure cook test(121℃,100%RH,2 ATM)
- Setting range: 100~158℃
- Vender: HIRAYAMA
- Model: PC305SIII
|
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- Name: Oven
- Function: High Temperature Storage test
- Setting range: +50 ~ 200℃
- Vender: TERCHY
- Model: CK-290
|
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- Name: Temperature and Humidity Chamber
- Function: TTemperature and Humidity storage test
- Setting range: -40 ~ 100℃/20% ~ 98%RH
- Vender: TERCHY
- Model: MHU-408LB
|
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- Name: Oven
- Function: High Temperature Storage test
- Setting range: +50 ~ 200℃
- Vender: AOPENG
- Model: AP-8933
|
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- Name: Temperature Cycling Chamber
- Function: Temperature Cycling Storage Test(isothermal rate)
- Setting range: -65 ~ 150℃
- Vender: KSON
- Model: KESS-P
|
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- Name: Steam ageing chamber
- Function: Steam-aging Test
- Setting range: 60~98℃
- Vender: KSON
- Model: FHT-B
|
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- Name: Temperature Cycling Chamber
- Function: Temperature Cycling Storage Test(non-isothermal rate)
- Setting range: -65 ~ 200℃
- Vender: ESPEC
- Model: TSG-70H-W
|
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- Name: Highly-Accelerated Temperature and Humidity Stress Test Chamber
- Function: High Temperature & humidity and pressure Test
- Setting range: 105℃ ~ 142.9℃/ 65% ~100%RH/ 1.2 ~4.0kg/cm2
- Vender: TERCHY
- Model: HAS-70
|
Failure Analysis Service
| Equipment |
Capability |
| SAM(Scanning Acoustic Microscopes) |
High resolution,non-destructive detection of delamination,void,crack |
| SEM(Scanning Electron Microscopes) |
Up to x150,000 Magnification Inspection |
| EDS(Energy Dispersive Spectrum) |
Surface Composition Analysis / depth>3um,detective limit ≧ 0.5% |
| Chemical Auto-Decapsulator |
Encapsulation removal by Chemical etching |
| Grinder/Polisher |
Package Cross-sectioning or Delayering |
| Optical Microscopes |
Up to 1000X Magnification Optical Inspection |
| X-Ray/CT |
Real time Microfocus X-ray/500nm resolution |
| Spiral Viscometer |
Measurement Range : 5.0pa·s~800pa·s |
| Solder Paste Analyzer System |
Content test:
Solder paste tack ability measurement.
Slumping ability test.
Solder ball residue test.
|
| Laser De-cap |
8micron resolution de-cap |
| Ion Chromatography |
electrical conductance definition : 0.0047 Ns /cm |
| FTIR |
Optical spectrum：7600-450cm-1（DTGS detector），7600-650cm-1（MCT-A detector）;spatial resolution：10μm |
| I-V Curve trace |
Accurate measurement ranges of 0.1 fA - 1 A and 0.5 μV - 200 V |
Major Equipments of FA
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- Name: Scanning Acoustic Microscope
- Function: Check IC package delamination,crack,void
- Setting range: 15M,50M,110M
- Vender: SONIX
- Model: ECHO-LS
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- Name: De-cap
- Function: ETCH MOLDING COMPOUND
- Setting range: SOIC&MMIC
- Vender: B&G
- Model: D-CAP2i Delta
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- Name: SEM and EDS
- Function: Visual inspection and element analysis
- Setting range: Magnification 5X~300kX/2nd to 92nd element
- Vender: Tescan
- Model: VEGA3/X-ACT
|
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- Name: Auto GRINDER
- Function: Grind and Polish
- Setting range: 30~600rpm
- Vender: BUEHLER
- Model: PHOENIX BETA VECTORTM POWRE HEAD
|
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- Name: Ion Chromatograph
- Function: Ion viscosity Test (F/Cl/Br/I/SO4/NO3)
- Vender: Dionex
- Model: ICS-900
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- Name: X-ray
- Function: Nondestructive inspection
- Vender: DAGE
- Model: XD7600-NT Ruby FP
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- Name: Current trace
- Function: IV Profile
- Setting range: 0.1fA ~ 1A and 0.5uV ~ 200V
- Vender: Keysight
- Model: 2 Bus Multi Trace system
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- Name: FTIR
- Function: Material analysis
- Vender: Thermal Scientific
- Model: iN10
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