Reliability and Failure Analysis
Availability of Failure Analysis Tools
| FA Item |
Full name |
Purpose |
| Cross Section |
Cross Section |
Confirm pad of component and pad of golden ball if grinding condition |
| SAM |
Scanning Acoustic Microscope |
Confirm defect on every layer on product, check IC package delamination, crack, void |
| SEM |
Scanning Electron Microscope |
Visual inspection and element analysis |
| EDS |
Energy Dispersive Spectroscopy |
Material surface analysis, investigation of product failures, |
| Strain Gauge |
Strain Gauge Measurement |
Strain gauge measurement for PCBA, |
| 3D Microscope |
3D Microscope |
Take picture pad of golden ball to evaluate surface and pad of golden ball coverage (IMC Coverage Measurement, Ball Size) |
| 2D & 3D X Ray |
2D & 3D X Ray |
Nondestructive inspection |
| Dye & Pry |
NA |
Destructive analysis technique used to inspect solder joint integrity. It is an application of dye penetrant inspection |
| Cratering |
NA |
Confirm pad of golden ball is there any crack or broken |
| ICT |
Ion Chromatography |
For quantitative testing of electrolyte and proprietary additives of electroplating baths |
Lab-Major Equipments of FA
Name: SEM and EDS
Function: Visual inspection and element analysis
Setting range: Magnification 5X~300kX/2nd to 92nd element
Vender: JEOL
Model: JSM-6700F/INCA
Name: Auto GRINDER
Function: Grind and Polish
Setting range: 30~600rpm
Vender: BUEHLER
Model: PHOENIX BETA VECTORTM POWRE HEAD
Name: Scanning Acoustic Microscope
Function: Check IC package delamination, crack, void
Setting range: 15M,25M,75M
Vender: SONIX
Model: UHR-2001
Name: 3D X-ray
Function: Nondestructive inspection
Setting range: 15M,25M,75M
Vender: DAGE
Model: XD7600-NT
Name: Strain Gauge
Function: PCBA stress FA
Vender: AKEMOND
Model: TSK-32-32C
Name: 3D Microscope
Function: PCBA stress FA
Setting range: For 100X~1000X
Vender: KEYENCE
Model: VHX-900F
Lab- Reliability Test
| Item |
Equipment Use |
Condition |
Testing Frequency |
| HTOL/HTS |
Oven |
HTOL Temp Case: 70 oC, VCC 3.3V HTS 85 oC |
New product qualification, line change qualification, ORT |
| uBDH/BDH |
TH |
uBDH Ta = 85°C, RH = 85% BDH Temperature Case 70 oC, VCC 3.3V |
New product qualification, line change qualification, ORT |
| TMCL |
TC |
-40 oC/ 15 min, +85 oC/ 15 min, 10 min transfer |
New product qualification, line change qualification, ORT |
| Mechanical Shock (MS) |
Mechanical Shock |
500g/1ms, 5x/axis, 6 axes |
New product qualification, line change qualification, ORT |
| Mechanical Vibration (MV) |
Mechanical Vibration |
20g, 20-2000 Hz, ≥4min/cycle, 4 cycles/axis, 3 axes |
New product qualification, line change qualification, ORT |
| Wiggle Test |
Wiggle Tester |
360deg continuous rotation, Loading requirements: MTP/MTRJ (SM & MM) – 0.25lbf |
New product qualification, ORT |
| HAST |
HAST Chamber |
110℃, RH 95%, 96 Hours |
New product qualification, line change qualification |
Lab-Major Equipments of RA
Name: TC Chamber
Function: TC storage test(isothermal rate）
Setting range:-65 ~ 150℃
Vender: KSON
Model: KSRB-315T-RBS
Name: TH Chamber
Function: Temp. and humidity Cycling Test
Setting range:-40 ~ 100℃ : 10 ~ 98%RH
Vender: TERCHY
Model: MHU-408LB
Name: TH Chamber
Function: TH storage or Operation Test
Setting range:-40~ 150℃/25% ~ 98%RH
Vender: KSON
Model: KTHB-715TBS
Name: High Temperature Chamber
Function: High Temperature Storage or Operation Test
Setting range:+50 ~ 200℃
Vender: TERCHY
Model: MCK-290
Name: Smoke Tester Chamber
Function: Make Smoke particle and Test the particle count
Vender: Bonan
Name: Dust Tester Chamber
Function: Make Dust Particle in the chamber
Particle Range: 0~80um
Vender: Huache